Time-Based Delay Line Analog to Digital Converter

ABSTRACT

Embodiments of the present disclosure include a differential digital delay line analog-to-digital converter (ADC). The ADC includes differential digital delay lines, a circuit including a set of delay elements included in the differential digital delay lines, and another circuit including another set of delay elements included in the differential digital delay lines. The first circuit is configured to generate data representing an analog to digital conversion of an input. The second circuit is configured to calibrate a source to the differential digital delay lines.

PRIORITY

The present application claims priority to U.S. Provisional Applications62/321,668; 62/321,685; 62/321,687; and 62/321,694, each filed Apr. 12,2016, and which are hereby incorporated in their entirety.

TECHNICAL FIELD

The present disclosure relates to time-based delay line analog todigital converters (ADC), in particular such converters with backgroundcalibration, range adjustment and out of range estimation.

BACKGROUND

Many different kinds of ADCs exist and their use often depends on theapplication. ADCs may vary according to a bit size, wherein the analogsignal will be digitized into 2^(n) different digital values, whereinthe ADC is an n-bit converter, using n-bits to represent the range ofanalog values. Moreover, ADCs may include an input range for the analogsignal. The lowest digitized output of the ADC (e.g., 00000000 for an8-bit ADC) may correspond to the lower limit of analog signal input. Thehighest digitized output of the ADC (e.g., 11111111 for an 8-bit ADC)may correspond to the upper limit of analog signal input. Such examplevalues may specify positive or unsigned values, though two's complementbinary enumeration may be used instead. An ADC may have a definedbandwidth that may correspond to a sampling rate, or how often theanalog signal is sampled. The ADC may output values according to varyingdegrees of linearity.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates an example over range protection variable resolutiondifferential delay line ADC, according to embodiments of the presentdisclosure;

FIG. 2 illustrates a representation of an input circuit, according toembodiments of the present disclosure;

FIG. 3 illustrates a typical usage model of an ADC, according toembodiments of the present disclosure;

FIG. 4 illustrates a timing diagram of operation of ADC, according toembodiments of the present disclosure;

FIG. 5 illustrates an example front end, according to embodiments of thepresent disclosure;

FIG. 6 illustrates example delay cells, according to embodiments of thepresent disclosure;

FIG. 7 is a more detailed view of ADC, according to embodiments of thepresent disclosure;

FIG. 8 is an illustration of an example system, microcontroller, orother device configured to incorporate an ADC, according to embodimentsof the present disclosure;

FIG. 9 is an illustration of a microcontroller with an ADC featuringdigital comparators for controlling PWM, according to embodiments of thepresent disclosure; and

FIG. 10 is another, more detailed view of an ADC, according toembodiments of the present disclosure.

SUMMARY

Embodiments of the present disclosure include a differential digitaldelay line ADC, including differential digital delay lines, a firstcircuit comprising a set of delay elements included in the differentialdigital delay lines, and a second circuit comprising another set ofdelay elements included in the differential digital delay lines. Incombination with any of the above embodiments, the first circuit isconfigured to generate data representing an analog to digital conversionof an input. In combination with any of the above embodiments, thesecond circuit is configured to calibrate a source to the differentialdigital delay lines. In combination with any of the above embodiments,the first circuit is configured to measure a difference between an inputvoltage and a reference voltage. In combination with any of the aboveembodiments, the ADC includes a current source circuit configured tomirror reference currents to each of the differential digital delaylines. In combination with any of the above embodiments, the currentsource circuit is configured to mirror reference currents to each of thedifferential digital delay lines, wherein the second circuit isconfigured to adjust the reference currents to minimize error. Incombination with any of the above embodiments, the ADC includes atransconductor configured to convert an input differential voltage to adifferential current, wherein the first circuit is configured to measurethe differential current and generate data representing the differentialvoltage. In combination with any of the above embodiments, the ADCincludes a transconductor configured to convert an input differentialvoltage to a differential current, and accept an input based on theplurality of differential digital delay lines to adjust avoltage-to-current range. In combination with any of the aboveembodiments, each differential digital delay line includes a chain ofcurrent limited buffers. In combination with any of the aboveembodiments, a given differential digital delay line is configured tooperate at a speed according to a differential current applied to thegiven differential digital delay line. In combination with any of theabove embodiments, the ADC further includes a latch configured to savedata from a slower differential digital delay line upon a completion offaster differential digital delay line. In combination with any of theabove embodiments, the ADC includes a third circuit comprising yetanother set of delay elements included in the differential digital delayline, wherein the third circuit is configured to produce data toindicate a degree to which an input to the ADC is out of an input range.In combination with any of the above embodiments, the ADC furthercomprises a third circuit to calibrate the ADC by adjusting lengths ofthe digital delay lines independently from one another. In combinationwith any of the above embodiments, the ADC further comprises a thirdcircuit to calibrate the ADC by adjusting lengths of the digital delaylines independently from one another, the third circuit includingmultiplexer to selectively use a portion of a given digital delay lineto shorten or lengthen the given digital delay line.

Embodiments of the present disclosure include a differential digitaldelay line ADC, including differential digital delay lines, a firstcircuit comprising a set of delay elements included in the differentialdigital delay lines, and a second circuit comprising another set ofdelay elements included in the differential digital delay lines. Incombination with any of the above embodiments, the first circuit isconfigured to generate data representing an analog to digital conversionof an input. In combination with any of the above embodiments, thesecond circuit is configured to produce data to indicate a degree towhich an input to the ADC is out of an input range. In combination withany of the above embodiments, the first circuit is configured to measurea difference between an input voltage and a reference voltage. Incombination with any of the above embodiments, the ADC includes acurrent source circuit configured to mirror reference currents to eachof the differential digital delay lines. In combination with any of theabove embodiments, the ADC includes a current source circuit configuredto mirror reference currents to each of the differential digital delaylines, wherein the second circuit is configured to adjust the referencecurrents to minimize error. In combination with any of the aboveembodiments, the ADC includes a transconductor configured to convert aninput differential voltage to a differential current, wherein the firstcircuit is configured to measure the differential current and generatedata representing the differential voltage. In combination with any ofthe above embodiments, the transconductor is configured to accept aninput based on the plurality of differential digital delay lines toadjust a voltage-to-current range. In combination with any of the aboveembodiments, each differential digital delay line includes a chain ofcurrent limited buffers. In combination with any of the aboveembodiments, a given differential digital delay line is configured tooperate at a speed according to a differential current applied to thegiven differential digital delay line. In combination with any of theabove embodiments, the ADC further comprises a latch configured to savedata from a slower differential digital delay line upon a completion offaster differential digital delay line. In combination with any of theabove embodiments, the ADC further includes a third circuit comprising ayet another set of delay elements included in the differential digitaldelay line, wherein the third circuit is configured to calibrate asource to the differential digital delay lines. In combination with anyof the above embodiments, the ADC further comprises a third circuit tocalibrate the ADC by adjusting lengths of the digital delay linesindependently from one another. In combination with any of the aboveembodiments, the ADC further comprises a third circuit to calibrate theADC by adjusting lengths of the digital delay lines independently fromone another, the third circuit including multiplexer to selectively usea portion of a given digital delay line to shorten or lengthen the givendigital delay line.

Embodiments of the present disclosure include processors,microcontrollers, electronic devices, die packages, semiconductorpackages, and semiconductor devices including any of the ADCs of theabove embodiments.

Embodiments of the present disclosure include methods performed by anyof the ADCs of the above embodiments.

DETAILED DESCRIPTION

FIG. 1 illustrates an example over range protection variable resolutiondifferential delay line ADC 100, according to embodiments of the presentdisclosure.

ADC 100 may be used in, for example, switched-mode power systems (SMPS).An SMPS control loop may utilize measurements of analog values. Thecontrol loop may require fast, one-execution-cycle measurements. Readingand acting on values measured by ADC 100 in a single cycle may improvestability and efficiency of the SMPS. Accordingly, a very fastimplementation of ADC 100 may be needed. Speed of ADC 100 may affectresolution of ADC 100 in order to update, during run-time,pulse-width-modulation (PWM) commands during a PWM cycle.

ADC 100 may be implemented as a digital delay line (DDL) ADC. Throughimplementation as a digital delay line ADC, ADC 100 may perform itsmeasurements at a lower cost and less power than conventional flashADCs. In one embodiment, ADC 100 may include background calibration. Inanother embodiment, ADC 100 may include range adjustment. In yet anotherembodiment, ADC 100 may estimate how far out of a desired range that itsanalog input would be measured. Incorporating background calibration orrange adjustment improves performance and functionality. When the errorvoltage of ADC 100 goes out of range, it can be difficult for controlloops using ADC 100 to re-acquire a lock. The out of range estimatecreated by ADC 100 provides the direction, and a qualitative estimate ofthe error, so that an algorithm can make necessary adjustment. Even ifthe estimate is outside the accurate range of the ADC, a qualitativeestimate of just how far outside the accurate range the estimate is mayallow better action and performance.

ADC 100 may be implemented largely with digital, low voltage logic.Accordingly, ADC 100 may be small with respect to footprint or die size.Furthermore, ADC 100 may thus require low power. Also, ADC 100 may thusoperate very fast. Accordingly, ADC 100 may be used as anerror-calculating ADC in an SMPS control loop.

Background calibration may improve ADC 100 performance with regards tokey metrics such as resolution and accuracy. Range adjustment may makeSMPS control loops more flexible and adaptable to system needs forwhatever system ADC 100 is implemented. Out of range estimation mayprovide useful information when ADC 100 is out of its linear range (withrespect to its input). Furthermore, ADC 100 may specify as part of theestimation a qualitative or quantitative magnitude and sign or directionof the out-of-range input.

By implementing ADC 100 as a delay line ADC, ADC 100 may convert adifferential voltage into differential currents. FIG. 2 illustrates arepresentation of an input circuit 200, according to embodiments of thepresent disclosure. Input circuit 200 may interface with ADC 100 or maybe implemented as part of ADC 100. Input circuit 200 may be configuredto convert the differential voltage between an input voltage and areference voltage into a current. In particular, input circuit 200 mayconvert the differential voltage into a pbias and an nbias current.Input circuit 200 may be implemented by a set of transistors. Thedifference between the differential currents is related to thedifferential between the input voltage and the reference voltage. One ofthe pbias or nbias current will be stronger than the other. Moreover,one of the pbias or nbias currents will be stronger than the other to adegree that the input voltage or the reference voltage was higher.

Returning to FIG. 1, the outputs of pbias current and nbias current maybe applied as inputs 102, 104. ADC 100 may function with a data delayline through current starved buffers 116, 118. Each element of buffers116, 118 may activate to propagate its input when current fromrespective nbias 102, pbias 104 current reaches the element. The bufferstate might initially be all zeroes, and the convert signal 106 that isto be propagated may be a one. In other cases, the buffer state mightinitially be all ones, and the convert signal 106 that is to bepropagated may be a zero. As each element of buffers 116, 118 is toactivate to propagate its input when current from respective nbias 102,pbias 104 current reaches the element, the buffer associated with thelarger, and thus faster, current of nbias 102 or pbias 104 currents mayfill up first. The buffer may fill up with the propagated value fromconvert signal 106. The other buffer might not fill all the way up, butmay fill up according to the relative speed (and thus size) of itscurrent. Accordingly, ADC 100 may examine, upon completion of one ofbuffers 116, 118, the status of the incomplete buffer of buffers 116,118. Based upon the number of filled elements within the partiallyfilled buffer, the relative difference between nbias 104 and pbias 102may be ascertained. Based upon this relative difference, the differencebetween the input voltage and the reference voltage may be ascertained.Buffers 116, 118 may be referred to as current starved buffer in thatthe buffer is waiting to activate until current is received from pbias102 or nbias 104. Buffers 116, 118 will activate successively with aspeed related to the size of the respective differential currents.

ADC 100 may be configured to represent the difference in speeds betweenpbias 102 and nbias 104 through the relative speeds of each buffer 116,118 through a thermometer code. The code may be stored in latches 112.Latches 112 may store the thermometer code as a snapshot of buffers 116,118 upon completion of the first of pbias 102 and nbias 104. Uponcompletion of the first of pbias 102 or nbias 102, the respective bufferof buffers 116, 118 may output its signal that, instead of propagatingto the next delay element, may become done+ or done−, respectively.Done+ may represent that buffer 116 has finished propagating (due topbias 102), and done− may represent that buffer 118 has finishedpropagating (due to nbias 104). An OR gate may combine done+ and done−to generate a done signal. The done signal may be fed as a control toset the values of latches 112. Thus, latches 112 may accept its valueswhen the done signal is generated, which would be upon the completion ofthe first of buffers 116, 118. The one of done+ and done− that is set orcompleted may be saved as a sign, indicating the sign of thedifferential. The sign may be represented by whichever of psign andnsign is set. Latches 112 may also be set or reset according to whetherthe convert signal has been issued.

At the time at which the values of latches 112 are to be set (becausenbias 102 or pbias 104 has finished passing through its respectivebuffer), the present values of buffers 116, 118 may be loaded intolatches 112. In one embodiment, a modified version of the values may beloaded into latches 112. For example, the values from correspondingelements of buffers 116, 118 may be passed together through a NAND gatebefore the result is stored in a corresponding element of latches 112.As a result, latches 112 may store a string of ones followed by a stringof zeroes, and the location at which the ones switch to zeroes mayrepresent the location at which the slower of pbias 102 or nbias 104reached in its respective buffer when the faster of pbias 102 or nbias104 reached the end of its respective buffer and generated a donesignal. The thermometer code showing this location of the slower ofpbias 102 or nbias 104 may be converted by a shift register, multiplier,or other algorithmic circuit in thermometer to binary converter 114. Theresulting data 106 may be used to show the relative difference betweenpbias 102 and nbias 104. The difference in the voltage that generatedpbias 102 and nbias 104 may then be inferred from the resulting data106. In some embodiments, such as in voltage regulators, this differencemay be the difference between actual output voltage of the regulator andthe desired level of output voltage of the regulator.

ADC 100 includes buffers 116, 118 implemented with digital cells.Accordingly, ADC 100 may have a small footprint or die requirement aswell as low power. ADC 100 may thus be faster than other ADCs. Moreover,using DDL buffers, ADC 100 may be faster and smaller than otherimplementations. In contrast, an ADC implemented as a conventional flashADC might be fast, but in current submicron technology nodes may belarge and consume significant current. A delay line ADC such as ADC 100may be comparatively much smaller and lower power.

FIG. 3 illustrates a typical usage model of ADC 100, according toembodiments of the present disclosure. In particular, 302 illustratesuse of an ADC in a voltage regulator feedback determination, wherein theADC fails to implement the teachings of the present disclosure. 304illustrates use of ADC 100 in a voltage regulator feedback, according tothe teachings of the present disclosure.

In 302, a voltage sense (Vsense) may sense voltage as-outputted by avoltage regulator. This voltage is to be compared against a referencevoltage. The reference voltage may be specified by a control loopcommand code applied to a digital-to-analog-converter, which may producean analog signal of the desired voltage reference level. The Vsense andthe reference voltage may be input into a comparator. The comparator mayalso be connected to another voltage reference (Vbg) to support oraccommodate signed error results. Vbg may also be referenced by the ADCitself. An error may be output from the ADC, representing the controlloop error between the reference voltage and Vsense.

In 304, the voltage sense and the reference voltage may be applied toADC 100. Additional elements, such as Vbg, may be unnecessary.Furthermore, the comparator used in 302 may be unnecessary.

Returning to FIG. 1, in one embodiment, ADC 100 may include delayelements to perform out-of-range estimation. Each of buffers 116, 118may include p delay elements. The p delay elements may be sufficient forADC 100 to implement a ADC conversion with a resolution of q bits. Theconversion of voltage differential to a binary data 106 may be performedwith n delay elements. The thermometer code may be n bits wide. However,there may be additional delay elements included in each of buffers 116,118 before such n delay elements that are actually used for voltagedifferential calculation. There may be any suitable number of such delayelements, such as 1 up to m such delay elements. The output of theseadditional delay elements may be output as overflow 120. These extradelay elements and resulting bits at the beginning of respective buffers116, 118 may be included in ADC 100 so that the transconductor of thevoltage-to-current converter of FIG. 2 and that then delay cells of ADC100 may operate within linear regions. Without inclusion of the m delaycells, the speed of the current through the n delay cells might not beprecisely proportional to the current differential generated by thevoltage-to-current converter.

In one embodiment, ADC 100 may capture the output of them delay cells asoverflow 120. Overflow 120 may be used to generate an estimate of thevoltage value of the vsense when it is out of range with respect to thecurrent settings. The estimate may be used by part of the system inwhich ADC 100 is implemented to take corrective action. The correctiveaction may include changing an input range for ADC 100, changing thereference voltage, or other suitable action.

For example, the input range of ADC 100 may be 200 millivolts. If thereference voltage is 1.0 V, and the sensed voltage is 1.4 V, ADC 100 mayproduce a thermometer code corresponding to a voltage difference of 0.2V. However, the maximum differential that can be represented given theresolution of ADC 100 is 0.2 V. Accordingly, ADC 100 may report that thedifferential between the sensed voltage and the reference voltage is 0.2V. However, a consumer of such information may recognize that thedifferential value is the maximum value reportable by ADC 100, and thusit is likely that the actual differential is greater than the reportedvalue.

ADC 100 may provide overflow 120. A consumer of the output of ADC 100may utilize overflow 120 when the output of ADC 100 indicates a maximumvoltage differential of inputs of ADC 100. In one embodiment, overflow120 may be reused from existing delays of an ADC 100 from portions ofbuffers 116, 118 that are not used to represent voltage differentialfrom the range of input values of ADC 100. As discussed above, overflow120 may be reused from delays that are used to linearize thermometercode with the current differential.

In one embodiment, when data 106 is a maximum or minimum value (whereinthe maximum versus minimum nature is specified by the sign of data 106)overflow 120 may be evaluated qualitatively. Such an evaluation may bebecause of the non-linear range of the transconductor or delay cell.

In one embodiment, ADC 100 may be configured to perform rangeadjustment. Input ranges for ADC 100 may be designed, for example, tohave a +/−200 mV or +/−400 mV range. The range may be selectable. In afurther embodiment, ADC 100 may select one of the available ranges (suchas +/−200 mV or +/−400 mV) based upon prior outputs of data 106. Forexample, if data 106 indicates a maximum differential and the inputrange is selected as +/−200 mV, then the input range may be changed to+/−400 mV. In another example, if data 106 indicates that the voltagedifferential is less than half of the available input range and theinput range is +/−400 mV, then the input range may be changed to +/−200mV. The narrower range might be used to increase effective resolutionwhile a same number of bits are used. The wider range might be usedinitially to find an initial error voltage and then as SMPS controlloops bring measured and reference voltages to a closer level, the rangemay be decreased.

In one embodiment, ADC 100 may be configured to perform calibration. Forexample, calibration might be performed by adjusting the current toindividual ones of pbias 102 or nbias 104. In another example,calibration might be performed by adjusting the current to both of pbias102 and nbias 104. Adjusting the current may adjust the speed or offsetof pbias 102 or nbias 104. The current may be adjusted according to acalibration line in the overflow. For example, if the overflow indicatesthat the differential is great, the current in a current source circuitmay be adjusted up or down according to a sign of the differential.

In another embodiment, ADC 100 may be configured to perform calibrationby adjusting the length of delay lines 116, 118. The length of delaylines 116, 118 may be effectively adjusted by adding enable elementssuch as multiplexers to selectively eliminate usage of some of thedelays in delay lines 116, 118.

FIG. 4 illustrates a timing diagram of operation of ADC 100, accordingto embodiments of the present disclosure. As show, a convert signal maystart an analog to digital conversion. Clearing the convert signal mayact as a reset. Upon finishing of one of the first of the nbias or pbiassignal, the associated delay line will finish. Accordingly, the latchsignal will be triggered and the associated thermometer code will belatched. The thermometer code may be decoded to a digital value during atime of suitable length. When the convert signal goes low again, thedelay lines may be reset. If necessary, calibration and out-of-rangeestimations may be applied.

FIG. 5 illustrates an example front end, according to embodiments of thepresent disclosure. The front end may include an implementation of thevoltage to current converter shown in FIG. 2. The front end may beimplemented in part with a transconductor. The transconductor mayconvert differential voltage into differential current and the rangeselection is done by adjusting its impedance value R_(s). Thetransconductor may be defined according to its transconductance g_(m),which may be given according to the differential current output dividedby the differential voltage input. The overall output current of thefront end may be given by:

$I = {\frac{g_{m\; 1}}{1 + {g_{m\; 1}\frac{R_{s}}{2}}}\Delta \; v_{o}}$

The impedance of the front end may thus be adjusted in order to adjustthe output current.

FIG. 6 illustrates example delay cells, according to embodiments of thepresent disclosure. Two corresponding delay cells and an associatedportion of a latch are illustrated. The three may be implemented as astack in order to create, in essence, a triple-height row or stack for acombined element. In each delay cell, output from the previous cell maybe routed to a clock signal input and the pbias or nbias signal may berouted to a bias input. Once both inputs are high, the output may berouted to the next element.

FIG. 7 is a more detailed view of ADC 100, according to embodiments ofthe present disclosure. As shown in FIG. 7, in various embodiments delaylines 116, 118 may be divided into optionally trimmed delay cells 702,over-range delay cells 704, and data delay cells 706. In someembodiments, one of trimmed delay cells 702 and over-range delay cells704 may be omitted. Furthermore, one or more of these groups of cellsmay be divided into cell ranges according to desired precision of ADC100. In one embodiment, data delay cells 706 may be divided into cellranges according to desired precision. In another embodiment, data delaycells 706 and over-range delay cells 704 may be divided into cell rangesaccording to desired precision.

For example, some of the delay cells may be grouped into the number ofdata cells needed to support 5-bit precision for ADC 100 with amultiplexer 712. In another example, some of the delay cells may begrouped into the number of data cells needed to support 6-bit precisionfor ADC 100 with a multiplexer 710, or into 7-bit precision for ADC 100with a multiplexer 708. Each such multiplexer may enable delay operationfor the delay cells within the delay lines that follow the multiplexer.Thus, portions of the delay lines may be selectively activated accordingto a precision mode. The precision mode may be set according to adesired mode of ADC 100, user or software operation, or dynamically byADC 100 in response to over-voltage or under-voltage situations.Enablement of 5-bit precision may enable all subsequent delay cellsuntil the done signal generation. Similarly, enablement of 6-bitprevision may enable all subsequent delay cells until the done signalgeneration. The enablement of 5-bit precision delay cells may beperformed. Similarly, enablement of 7-bit prevision may enable allsubsequent delay cells until the done signal generation. The enablementof 5-bit and 6-bit precision delay cells may be performed.

Accordingly, there may be overlap between some of groups 704 and 706 indifferent cases and at different times. Cells not used for over-rangemight be used for regular data. Similarly, cells not used for data mightbe used for over-range. Moreover, the configuration of optionallytrimmed delay cells 702 may be applied to elements of groups 704 or 706.While bit groupings 708, 710, 712 may be accomplished with a multiplexerapplied to an entire group, within a given such bit grouping, individualmultiplexers may be applied to trim portions thereof.

In group 702, individual multiplexers for delay cells may trim or omituse in propagation lines. In some cases, the multiplexer operation fordelay cells in the nbias delay line might differ from correspondingdelay cells in the pbias delay line. Accordingly, the length of thedelay lines might be adjusted so as to compensate for offsets, such thatone of the pbias or nbias lines does not go through as many delayelements as the other delay line. The multiplexers for trimming thepbias lines may be controlled through the indexed commands of bp, andmultiplexers for trimming the nbias lines may be controlled through theindexed commands of bn. Trimming the delay line may calibrate therespective current values.

FIG. 8 is an illustration of an example system, microcontroller 800, orother device configured to incorporate ADC 100, according to embodimentsof the present disclosure. ADC 100 may be included in microcontroller800 as a DDL ADC 812. A processor 802, memory 806, conventional ADC 810,and PWM circuit 812 may also be included. These may be communicativelycoupled through a suitable data bus 802.

Operation of DDL ADC 812 may be initiated on behalf of microcontroller800 upon execution of instructions in memory 806 by processor 802. Theinstructions may be for various parts of PWM 812 to perform voltageregulation. As part of the voltage regulation, voltage comparisons maybe made by DDL ADC 812 or conventional ADC 810. Depending upon theresults from DDL ADC 812, processor 804 may take corrective actions. Forexample, PWM settings might be adjusted based upon immediate conductorinformation.

Operation of DDL ADC 812 with respect to the rest of microcontroller 800may be made without having to use interrupt service routines (ISRs), aswould be used by conventional ADC 810. Moreover, there might be no needfor direct memory access (DMA) to utilize DDL ADC 812, as would be thecase when conventional ADC 810 is used. Seven instances of DDL ADC 812might be smaller than a 15 ns comparator, and as fast as an analogcomparator.

FIG. 9 is an illustration of a microcontroller with a DDL ADC featuringdigital comparators for controlling PWM, according to embodiments of thepresent disclosure.

In other applications, pure analog comparators might monitor theapplication to detect over or under current or over or under voltageconditions and directly turn off or on PWM signals. However, such analogcomparators are limited to a single output, yet might be fast. In otherapplications, ADCs incorporate digital comparators to detect out ofrange operation and generate interrupts to a processor so software canmake adjustments to the PWM. ADCs can provide multiple bits of output tosoftware but are slow relative to a power supply control loop.

By use of ADC 100, the microcontroller might take advantage of the veryhigh speed of the ADC 100. Digital comparators and associated registersmay monitor the ADC 100 data output and assert digital output signalswhen the data meets the comparison criteria. These output signals mightbe connected to a PWM circuit to provide immediate control(modification) of the PWM output signals.

Instances of ADC 100 may output their values to one or more PWMcontrollers or circuits. These may be routed through an ADC bus directlyto one or more digital comparators. The digital comparators may beimplemented in respective PWM controllers or circuits, or may becommunicatively coupled thereto. The digital comparators may beprogrammed with register values or other indicators of which of ADC 100signals are to be used for a given digital comparator. Thus, a digitalcomparator may be designated to subscribe or accept data from a givenADC 100. Furthermore, a value by which the digital comparator is tocompare the ADC 100 signal may be specified in the register. A PWMcontroller may issue PWM signals based upon whether the differentialvoltage is greater than a threshold specified in the comparison valueregister. Moreover, different levels may be specified in the differentcomparison value registers. A PWM controller may issue PWM signals basedupon which thresholds that the differential voltage reaches.

The digital comparators may each have two outputs, a first outputindicating that the value is greater than a value stored in anassociated register and a second output indicating that the value isless or equal than the value stored in the associated register. Thecomparators according to other embodiments may have different outputsindicating using different operators such as equal, greater, less,greater or equal, less or equal, etc. The output signals provided by thecomparators can be used to control the PWM module directly. This designdoes not need to wait for interrupt service routines and there is noneed for DMA transfers.

FIG. 10 is another, more detailed view of ADC 100, according toembodiments of the present disclosure. Illustrated are multiplexers1006, 1008. Multiplexers 1006, 1008 may serve a similar purpose tomultiplexers 710, 712. Multiplexer 710 may be placed at the 50% pointfrom the DDL end. Multiplexer 712 may be placed at the 25% point fromthe DDL end. Other multiplexers, not shown, may be placed, for example,at the 12.5% point from the DDL end.

ADC 100 may include digital logic blocks, such as block 1002 and block1004, to load data from the latches. The enable signals for the digitallogic blocks may be tied to the multiplexer enablement. For example,when multiplexers 1006, 1008 are to enable full resolution, blocks 1002and 1004 may allow loading of all data from the latches. Whenmultiplexers 1006, 1008 are to enable half resolution, block 1002 may beturned off while block 1004 is turned on. Other logic blocks for quarterresolution and so forth are not shown. Such blocks also be used incoordination with the multiplexers of FIG. 7.

Each multiplexer closer to the end reduces the resolution by 1-bit butdoubles the speed of conversion when shutting down part of delay linesof ADC 100. The AND gates of the logic blocks between the data latchesand the thermometer to binary code converter select the applicableinputs for differing resolution selections. Such logic blocks might beimplemented instead between the delay lines and the latches.

By use of the logic blocks, the “ones” in unused delay line taps areprevented from corrupting data results. Multiplexers placed in the delaylines might also provide a mechanism to insert a reset value intomultiple points in the delay to yield a faster reset following aconversion cycle. This may reduce the time delay to when the nextconversion can begin.

Additions, changes, modifications, or other permutations of thisdisclosure may be made according to the knowledge, skill, andunderstanding of one of skill in the art.

1. A differential digital delay line analog-to-digital converter (ADC),comprising: a plurality of differential digital delay lines; a firstcircuit comprising a set of delay elements included in the differentialdigital delay lines; and a second circuit comprising another set ofdelay elements included in the differential digital delay lines;wherein: the first circuit is configured to generate data representingan analog to digital conversion of an input; and the second circuit isconfigured to calibrate a source to the differential digital delaylines.
 2. The ADC of claim 1, wherein the first circuit is configured tomeasure a difference between an input voltage and a reference voltage.3. The ADC of claim 1, further comprising a current source circuitconfigured to mirror reference currents to each of the differentialdigital delay lines.
 4. The ADC of claim 1, further comprising a currentsource circuit configured to mirror reference currents to each of thedifferential digital delay lines, wherein the second circuit isconfigured to adjust the reference currents to minimize error.
 5. TheADC of claim 1, further comprising a transconductor configured toconvert an input differential voltage to a differential current, whereinthe first circuit is configured to measure the differential current andgenerate data representing the differential voltage.
 6. The ADC of claim1, further comprising a transconductor configured to: convert an inputdifferential voltage to a differential current; and accept an inputbased on the plurality of differential digital delay lines to adjust avoltage-to-current range.
 7. The ADC of claim 1, wherein eachdifferential digital delay line includes a chain of current limitedbuffers.
 8. The ADC of claim 1, wherein: a given differential digitaldelay line is configured to operate at a speed according to adifferential current applied to the given differential digital delayline; the ADC further comprises a latch; and the latch is configured tosave data from a slower differential digital delay line upon acompletion of faster differential digital delay line.
 9. The ADC ofclaim 1, further comprising a third circuit comprising yet another setof delay elements included in the differential digital delay line,wherein the third circuit is configured to produce data to indicate adegree to which an input to the ADC is out of an input range.
 10. TheADC of claim 1, The ADC of claim 10, further comprising a third circuitthe calibrate the ADC by adjusting lengths of the digital delay linesindependently from one another.
 11. A differential digital delay lineanalog-to-digital converter (ADC), comprising: a plurality ofdifferential digital delay lines; a first circuit comprising a set ofdelay elements included in the differential digital delay lines; and asecond circuit comprising another set of delay elements included in thedifferential digital delay lines; wherein: the first circuit isconfigured to generate data representing an analog to digital conversionof an input; and the second circuit is configured to produce data toindicate a degree to which an input to the ADC is out of an input range.12. The ADC of claim 11, wherein the first circuit is configured tomeasure a difference between an input voltage and a reference voltage.13. The ADC of claim 11, further comprising a current source circuitconfigured to mirror reference currents to each of the differentialdigital delay lines.
 14. The ADC of claim 11, further comprising acurrent source circuit configured to mirror reference currents to eachof the differential digital delay lines, wherein the second circuit isconfigured to adjust the reference currents to minimize error.
 15. TheADC of claim 11, further comprising a transconductor configured toconvert an input differential voltage to a differential current, whereinthe first circuit is configured to measure the differential current andgenerate data representing the differential voltage.
 16. The ADC ofclaim 11, further comprising a transconductor configured to: convert aninput differential voltage to a differential current; and accept aninput based on the plurality of differential digital delay lines toadjust a voltage-to-current range.
 17. The ADC of claim 11, wherein eachdifferential digital delay line includes a chain of current limitedbuffers.
 18. The ADC of claim 11, wherein: a given differential digitaldelay line is configured to operate at a speed according to adifferential current applied to the given differential digital delayline; the ADC further comprises a latch; and the latch is configured tosave data from a slower differential digital delay line upon acompletion of faster differential digital delay line.
 19. The ADC ofclaim 11, further comprising a third circuit comprising a yet anotherset of delay elements included in the differential digital delay line,wherein the third circuit is configured to calibrate a source to thedifferential digital delay lines.
 20. The ADC of claim 10, The ADC ofclaim 11, further comprising a third circuit the calibrate the ADC byadjusting lengths of the digital delay lines independently from oneanother.
 21. A differential digital delay line analog-to-digitalconverter (ADC), comprising: a plurality of differential digital delaylines; a first circuit comprising a set of delay elements included inthe differential digital delay lines; and a transconductor configuredto: convert an input differential voltage to a differential current; andaccept an input based on the plurality of differential digital delaylines to adjust a voltage-to-current range.
 22. The ADC of claim 21,further comprising a second circuit comprising a yet another set ofdelay elements included in the differential digital delay line, whereinthe second circuit is configured to produce data to indicate a degree towhich an input to the ADC is out of an input range.